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news
about us
open jobs
1
team
visitors
alumni
contact
research
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research lines
nanoSeminars
events
projects
presentations
equipment
academics
our courses
choose your thesis
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Oxide reliability - Notes of an industry host fellowship
Michael Langenbuch
STMicroelectronics
Dec. 8, 2003, 2 p.m.
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The function of metal-oxide-semiconductor field effect
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Oxide reliability - Notes of an industry host fellowship
Michael Langenbuch
STMicroelectronics
Dec. 8, 2003, 2 p.m.
Add event to calendar
Add event to calendar
The function of metal-oxide-semiconductor field effect
Share
